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Disambiguation of "Kim, Youbean"

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Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing.

, , , , and . IET Comput. Digit. Tech., 1 (4): 369-376 (2007)

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Ky ng Kim

Die Artikelstruktur in passiven zweisprachigen Wörterbüchern Deutsch-Koreanisch: Konzeption zur Erstellung eines zweisprachigen Lernerwörterbuchs Deutsch-Koreanisch. Uni Heidelberg, (2008)

Kison Kim

Wonchan Kim

Kim Gerber

Bongcheol Kim

 

Other publications of authors with the same name

A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST., , , , and . IEICE Trans. Inf. Syst., 91-D (4): 1185-1188 (2008)Low Loss Hybrid-Plane PCB Structure for Improving Signal Quality in High-Speed Signal Transmission., and . IEEE Access, (2024)A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters., , , , and . IEICE Trans. Electron., 91-C (4): 670-672 (2008)Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method., , , and . IEICE Trans. Inf. Syst., 93-D (3): 643-646 (2010)A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals., , , and . IEICE Trans. Electron., 91-C (10): 1713-1716 (2008)A New Analog-to-Digital Converter BIST Considering a Transient Zone., , , , and . IEICE Trans. Electron., 90-C (11): 2161-2163 (2007)Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing., , , , and . IET Comput. Digit. Tech., 1 (4): 369-376 (2007)TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure., , , , and . ATS, page 17-24. IEEE, (2006)A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture., , , and . Asian Test Symposium, page 230-235. IEEE Computer Society, (2005)