%0 Journal Article %1 journals/tii/QiaoWJFGLZD24 %A Qiao, Dongdong %A Wei, Xuezhe %A Jiang, Bo %A Fan, Wenjun %A Gong, Hui %A Lai, Xin %A Zheng, Yuejiu %A Dai, Haifeng %D 2024 %J IEEE Trans. Ind. Informatics %K dblp %N 4 %P 6751-6761 %T Data-Driven Fault Diagnosis of Internal Short Circuit for Series-Connected Battery Packs Using Partial Voltage Curves. %U http://dblp.uni-trier.de/db/journals/tii/tii20.html#QiaoWJFGLZD24 %V 20

@article{journals/tii/QiaoWJFGLZD24, added-at = {2024-05-07T00:00:00.000+0200}, author = {Qiao, Dongdong and Wei, Xuezhe and Jiang, Bo and Fan, Wenjun and Gong, Hui and Lai, Xin and Zheng, Yuejiu and Dai, Haifeng}, biburl = {https://www.bibsonomy.org/bibtex/2cf87c9eb56cfd1380532ab40b8091db5/dblp}, ee = {https://doi.org/10.1109/TII.2024.3353872}, interhash = {b1b6a7052981eafe16eb389b41971685}, intrahash = {cf87c9eb56cfd1380532ab40b8091db5}, journal = {IEEE Trans. Ind. Informatics}, keywords = {dblp}, month = {April}, number = 4, pages = {6751-6761}, timestamp = {2024-05-13T07:15:14.000+0200}, title = {Data-Driven Fault Diagnosis of Internal Short Circuit for Series-Connected Battery Packs Using Partial Voltage Curves.}, url = {http://dblp.uni-trier.de/db/journals/tii/tii20.html#QiaoWJFGLZD24}, volume = 20, year = 2024 }