%0 Journal Article %1 journals/mr/BourgeatGDJMJ11 %A Bourgeat, J. %A Galy, Philippe %A Dray, A. %A Jimenez, Jean %A Marin-Cudraz, D. %A Jacquier, Blaise %D 2011 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1614-1617 %T A full characterization of single pitch IO ESD protection based on silicon controlled rectifier and dynamic trigger circuit in CMOS 32 nm node. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#BourgeatGDJMJ11 %V 51

@article{journals/mr/BourgeatGDJMJ11, added-at = {2020-02-22T00:00:00.000+0100}, author = {Bourgeat, J. and Galy, Philippe and Dray, A. and Jimenez, Jean and Marin-Cudraz, D. and Jacquier, Blaise}, biburl = {https://www.bibsonomy.org/bibtex/2797b8d05fa6aba52b252bf66fa3b321c/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.07.078}, interhash = {d40f498655da0fe984aa7fc3de24e9cf}, intrahash = {797b8d05fa6aba52b252bf66fa3b321c}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1614-1617}, timestamp = {2020-02-25T13:28:39.000+0100}, title = {A full characterization of single pitch IO ESD protection based on silicon controlled rectifier and dynamic trigger circuit in CMOS 32 nm node.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#BourgeatGDJMJ11}, volume = 51, year = 2011 }