%0 Conference Paper %1 conf/metrics/ShullBBBCLPRTZ02 %A Shull, Forrest %A Basili, Victor R. %A Boehm, Barry W. %A Brown, A. Winsor %A Costa, Patricia %A Lindvall, Mikael %A Port, Daniel %A Rus, Ioana %A Tesoriero, Roseanne %A Zelkowitz, Marvin V. %B IEEE METRICS %D 2002 %I IEEE Computer Society %K dblp %P 249- %T What We Have Learned About Fighting Defects. %U http://dblp.uni-trier.de/db/conf/metrics/metrics2002.html#ShullBBBCLPRTZ02 %@ 0-7695-1339-5

@inproceedings{conf/metrics/ShullBBBCLPRTZ02, added-at = {2023-03-23T00:00:00.000+0100}, author = {Shull, Forrest and Basili, Victor R. and Boehm, Barry W. and Brown, A. Winsor and Costa, Patricia and Lindvall, Mikael and Port, Daniel and Rus, Ioana and Tesoriero, Roseanne and Zelkowitz, Marvin V.}, biburl = {https://www.bibsonomy.org/bibtex/2374ab526692a4917c87030f8181980b9/dblp}, booktitle = {IEEE METRICS}, crossref = {conf/metrics/2002}, ee = {https://doi.ieeecomputersociety.org/10.1109/METRIC.2002.1011343}, interhash = {db17691bc345bfae8a1a573b08859ee0}, intrahash = {374ab526692a4917c87030f8181980b9}, isbn = {0-7695-1339-5}, keywords = {dblp}, pages = {249-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T10:05:25.000+0200}, title = {What We Have Learned About Fighting Defects.}, url = {http://dblp.uni-trier.de/db/conf/metrics/metrics2002.html#ShullBBBCLPRTZ02}, year = 2002 }