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Analog behavioral modeling for age-dependent degradation of complex analog circuits.

, , , , and . MIXDES, page 317-322. IEEE, (2014)

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NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits., , , and . IRPS, page 1. IEEE, (2015)Optimum Operating Points of Transistors with minimal Aging-Aware Sensitivity., , , and . SBCCI, page 14:1-14:7. ACM, (2015)Analog behavioral modeling for age-dependent degradation of complex analog circuits., , , , and . MIXDES, page 317-322. IEEE, (2014)Variability-aware gradual aging for generating reliability figures of a neural measurement system., , , and . MIXDES, page 380-385. IEEE, (2013)Variability-aware aging modeling for reliability analysis of an analog neural measurement system., , , and . ETS, page 1-6. IEEE, (2015)An aging-aware transistor sizing tool regarding BTI and HCD degradation modes., , , , and . MIXDES, page 272-277. IEEE, (2015)Modeling of an analog recording system design for ECoG and AP signals., , , , , and . DATE, page 1-6. European Design and Automation Association, (2014)Reliability analysis for integrated circuit amplifiers used in neural measurement systems., , , and . DATE, page 713-716. EDA Consortium San Jose, CA, USA / ACM DL, (2013)Design and verification of analog CMOS circuits using the gm/ID-method with age-dependent degradation effects., , , , , and . PATMOS, page 136-141. IEEE, (2016)Power efficient digital IC design for a medical application with high reliability requirements., , , , , , , , and . PATMOS, page 1-5. IEEE, (2014)