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A Study of Sense-Voltage Margins in Low-Voltage-Operating Embedded DRAM Macros.

, , , , , , , , , , , и . IEICE Trans. Electron., 88-C (10): 2020-2027 (2005)

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Hideyuki Sakamoto

Teruhisa Noda

Tatsuhiko Noda

Shigeru Noda

Norihiro Noda

 

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