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Unveiling Field Driven Performance Unreliabilities Governed by Channel Dynamics in MoSe2 FETs.

, , , , and . IRPS, page 1-6. IEEE, (2023)

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OFF State Reliability Challenges of Monolayer WS2 FET Photodetector: Impact on the Dark and Photo-Illuminated State., , , , and . IRPS, page 1-5. IEEE, (2023)Decoupling Current and Voltage Mediated Breakdown Mechanisms in CVD MoS2 FETs., , , , and . IRPS, page 1-7. IEEE, (2024)Defect Assisted Metal-TMDs Interface Engineering: A First Principle Insight., , , and . DRC, page 1-2. IEEE, (2020)Atomic-level Insight and Quantum Chemistry of Ambient Reliability Issues of the TMDs Devices., , , , and . IRPS, page 1-6. IEEE, (2023)Breakthrough Metal/Graphene Interface Phonon Engineering for Reliable Graphene Based-Heat Spreaders., , , , , , , , and . IRPS, page 1-5. IEEE, (2024)First Insights into Electro-Thermal Stress Driven Time-Dependent Permanent Degradation Failure of CVD Monolayer MoS2 Channel., , , and . IRPS, page 1-4. IEEE, (2020)Hot Carrier Dynamics and Electrical Breakdown Analysis in 2D Transition Metal Dichalcogenide FETs., , , , , , and . IRPS, page 74. IEEE, (2024)Unveiling Field Driven Performance Unreliabilities Governed by Channel Dynamics in MoSe2 FETs., , , , and . IRPS, page 1-6. IEEE, (2023)Are Argon and Nitrogen Gases Really Inert to Graphene Devices?, and . DRC, page 1-2. IEEE, (2022)Physical Insights into Phosphorene Transistor Degradation Under Exposure to Atmospheric Conditions and Electrical Stress., , , , , , , and . IRPS, page 1-4. IEEE, (2020)