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Disambiguation of "Touba, Nur A."

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Joint Minimization of Power and Area in Scan Testing by Scan Cell Reordering.

, , and . ISVLSI, page 246-249. IEEE Computer Society, (2003)

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Farid Toubal

Nicolas Toubanakis

Frank Eugen Toubartz

Nur Amin

Nur en Kurt

 

Other publications of authors with the same name

Test data compression using dictionaries with selective entries and fixed-length indices., , and . ACM Trans. Design Autom. Electr. Syst., 8 (4): 470-490 (2003)A Graph Theory Approach towards IJTAG Security via Controlled Scan Chain Isolation., and . VTS, page 1-6. IEEE, (2019)An efficient test vector compression scheme using selective Huffman coding., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 22 (6): 797-806 (2003)Selective Checksum based On-line Error Correction for RRAM based Matrix Operations., and . VTS, page 1-6. IEEE, (2020)Using asymmetric layer repair capability to reduce the cost of yield enhancement in 3D stacked memories., , and . VLSI-SoC, page 195-200. IEEE, (2012)Low-power weighted pseudo-random BIST using special scan cells., , , and . ACM Great Lakes Symposium on VLSI, page 86-91. ACM, (2004)An Embedded Core DFT Scheme to Obtain Highly Compressed Test Sets., , and . Asian Test Symposium, page 275-. IEEE Computer Society, (1999)X-canceling MISR - An X-tolerant methodology for compacting output responses with unknowns using a MISR.. ITC, page 1-10. IEEE Computer Society, (2007)Synthesis of nonintrusive concurrent error detection using an even error detecting function., and . ITC, page 8. IEEE Computer Society, (2005)Improving test compression with scan feedforward techniques., and . ITC, page 1-10. IEEE Computer Society, (2014)