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An ECC-based memory architecture with online self-repair capabilities for reliability enhancement., , , , и . ETS, стр. 1-6. IEEE, (2015)Core-Based Testing of Multiprocessor System-on-Chips Utilizing Hierarchical Functional Buses., , , и . ASP-DAC, стр. 720-725. IEEE Computer Society, (2007)Wrapper and TAM Co-Optimization for Reuse of SoC Functional Interconnects., и . DATE, стр. 1366-1369. ACM, (2008)DART: Dependable VLSI test architecture and its implementation., , , , , , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2012)A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation., , , и . ITC, стр. 1-8. IEEE Computer Society, (2012)Aging test strategy and adaptive test scheduling for SoC failure prediction., , , , , и . IOLTS, стр. 21-26. IEEE Computer Society, (2010)Detecting hardware Trojans without a Golden IC through clock-tree defined circuit partitions., , , и . ETS, стр. 1-6. IEEE, (2017)Test pattern selection to optimize delay test quality with a limited size of test set., , , , и . European Test Symposium, стр. 260. IEEE Computer Society, (2010)Area Overhead and Test Time Co-Optimization through NoC Bandwidth Sharing., , и . ATS, стр. 459-462. IEEE, (2007)Power-constrained test scheduling for multi-clock domain SoCs., , и . DATE, стр. 297-302. European Design and Automation Association, Leuven, Belgium, (2006)