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Accessing on-chip temperature health monitors using the IEEE 1687 standard.

, , and . ICECS, page 776-779. IEEE, (2016)

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An embedded offset and gain instrument for OpAmp IPs., and . DATE, page 1-4. European Design and Automation Association, (2014)Testing Microelectronic Biofluidic Systems.. IEEE Des. Test Comput., 24 (1): 72-82 (2007)Gate delay fault test generation for non-scan circuits., , , and . ED&TC, page 308-313. IEEE Computer Society, (1995)Design and Test Space Exploration of Transport-Triggered Architectures., , and . DATE, page 146-151. IEEE Computer Society / ACM, (2000)A design-for-testability expert system for silicon compilers., , and . VTS, page 10-15. IEEE Computer Society, (1991)Studying DAC capacitor-array degradation in charge-redistribution SAR ADCs., and . DDECS, page 15-20. IEEE Computer Society, (2014)Increasing the Fault Coverage in Multiple Clock Domain Systems by Using On-Line Testing of Synchronizers., and . IOLTW, page 95-99. IEEE Computer Society, (2001)Testing for Intermittent Resistive Faults in CMOS Integrated Systems., and . DSD, page 703-707. IEEE Computer Society, (2016)Testing of a Highly Reconfigurable Processor Core for Dependable Data Streaming Applications., and . DELTA, page 38-44. IEEE Computer Society, (2008)Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments., , and . APCCAS, page 370-373. IEEE, (2018)