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Improved Electrical Reliability and Performance Enhancements in SiGe HBTs Using Dummy BEOL Metal Layers.

, , , and . BCICTS, page 62-65. IEEE, (2022)

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DC and RF Variability of SiGe HBTs Operating Down to Deep Cryogenic Temperatures., , , , , , , , and . BCICTS, page 1-4. IEEE, (2019)The Impact of BEOL Stress on SiGe HBTs at Cryogenic Temperatures., , and . BCICTS, page 270-273. IEEE, (2023)Dynamic Behavior of Breakdown Mechanisms in SiGe HBTs., , , and . BCICTS, page 1-4. IEEE, (2021)Improved Electrical Reliability and Performance Enhancements in SiGe HBTs Using Dummy BEOL Metal Layers., , , and . BCICTS, page 62-65. IEEE, (2022)Compact Modeling of SiGe HBTs for Design of Cryogenic Control and Readout Circuits for Quantum Computing., , , , , , , and . BCICTS, page 1-4. IEEE, (2020)The Effects of Carbon Doping on the Performance and Electrical Reliability of SiGe HBTs., , , , , , , , , and 1 other author(s). BCICTS, page 253-256. IEEE, (2023)Circuit-Level Safe-Operating-Area of a High-Speed SiGe BiCMOS Wireline Driver., , , , , and . BCICTS, page 1-5. IEEE, (2020)Performance vs. Reliability Tradeoffs of Medium Breakdown and High Performance Cascode Amplifier Cells., , , , and . BCICTS, page 66-69. IEEE, (2022)Analysis of the Impact of Radiation-Induced Optical Transients on Deep-Space Optical Communications Systems using PPM., , , and . OFC, page 1-3. IEEE, (2021)