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A concurrent testing method for NoC switches.

, , , and . DATE, page 1171-1176. European Design and Automation Association, Leuven, Belgium, (2006)

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An efficient BIST method for testing of embedded SRAMs., , and . ISCAS (5), page 73-76. IEEE, (2001)Programmable Routing Tables for Degradable Torus-Based Networks on Chips., , and . ISCAS, page 1065-1068. IEEE, (2007)Modeling Timing Behavior of Logic Circuits Using Piecewise Linear Models., , , and . CHDL, volume A-32 of IFIP Transactions, page 569-586. North-Holland, (1993)Using Verilog VPI for Mixed Level Serial Fault Simulation in a Test Generation Environment., , and . Embedded Systems and Applications, page 139-143. CSREA Press, (2003)A Low Power BIST Architecture for FPGA Look-Up Table Testing., and . VLSI-SOC, page 394-397. Technische Universität Darmstadt, Insitute of Microelectronic Systems, (2003)Near-Optimal Node Selection Procedure for Aging Monitor Placement., , and . IOLTS, page 6-11. IEEE, (2018)HDLs evolve as they affect design methodology for a higher abstraction and a better integration.. DTIS, page 1. IEEE, (2015)On-Chip Verification of NoCs Using Assertion Processors., , , , and . DSD, page 535-538. IEEE Computer Society, (2007)An off-line MDSI interconnect BIST incorporated in BS 1149.1., , , and . ETS, page 1-2. IEEE, (2014)SCOAP-based Directed Random Test Generation for Combinational Circuits., , , and . EWDTS, page 1-5. IEEE, (2019)