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Complex Permittivity Effect on the Performances of Non-invasive Microwave Blood Glucose Sensing: Enhanced Model and Preliminary Results.

, , and . WorldCIST (2), volume 746 of Advances in Intelligent Systems and Computing, page 1505-1511. Springer, (2018)

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An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime., , , , and . IEEE Trans. Instrumentation and Measurement, 58 (8): 2663-2670 (2009)Theoretical and Experimental Analysis of a CSWPL Behavioral Model for Microwave GaN Transistors Including DC Bias Voltages., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 43 (3): 933-943 (March 2024)Analysis of Efficiency-Limiting Factors Resulting from Transistor Current Source on Class-F and Inverse Class-F Power Amplifiers., , , , , and . IEICE Trans. Electron., 105-C (10): 449-456 (October 2022)Doppler Elaboration for Vibrations Detection Using Software Defined Radar., and . WorldCIST (2), volume 570 of Advances in Intelligent Systems and Computing, page 1022-1028. Springer, (2017)Software-Defined Radar System for Landslides Monitoring., , , , , , and . WorldCIST (2), volume 445 of Advances in Intelligent Systems and Computing, page 325-331. Springer, (2016)Environmental Effects on the Performances of a UHF Passive Tag-Based Commercial RFID System., , , and . WorldCIST (2), volume 445 of Advances in Intelligent Systems and Computing, page 317-323. Springer, (2016)Quadrature Receiver Benefits in CW Doppler Radar Sensors for Vibrations Detection., , and . WorldCIST (2), volume 746 of Advances in Intelligent Systems and Computing, page 1471-1477. Springer, (2018)Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers., , , , , , , and . BCICTS, page 44-47. IEEE, (2018)Novel Varactor-Loaded Phasing Line for Reflectarray Unit Cell with Large Reconfigurability Frequency Range., , , , and . WorldCIST (2), volume 354 of Advances in Intelligent Systems and Computing, page 3-9. Springer, (2015)Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime., , , , , and . Microelectron. Reliab., 51 (2): 235-239 (2011)