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Generating Routing-Driven Power Distribution Networks with Machine-Learning Technique., , , , , , и . ISPD, стр. 145-152. ACM, (2016)Testing methods for a write-assist disturbance-free dual-port SRAM., , , , , , и . VTS, стр. 1-6. IEEE Computer Society, (2014)Mathematical yield estimation for two-dimensional-redundancy memory arrays., , и . ICCAD, стр. 235-240. IEEE, (2010)Power-switch routing for coarse-grain MTCMOS technologies., , , и . ICCAD, стр. 39-46. ACM, (2009)Fault models and test methods for subthreshold SRAMs., , , , и . ITC, стр. 427-436. IEEE Computer Society, (2010)Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks., , , , , , , , , и . VTS, стр. 1-7. IEEE, (2021)An Efficient Hamiltonian-cycle power-switch routing for MTCMOS designs., , и . ASP-DAC, стр. 59-65. IEEE, (2012)Methodology of Generating Timing-Slack-Based Cell-Aware Tests., , , , , , , , и . ITC, стр. 1-10. IEEE, (2019)Testing methods for quaternary content addressable memory using charge-sharing sensing scheme., , , , , , и . ITC, стр. 1-10. IEEE, (2015)Theoretical analysis for low-power test decompression using test-slice duplication., и . VTS, стр. 147-152. IEEE Computer Society, (2010)