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Disambiguation of "Shintani, Michihiro"

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Artificial Neural Network Based Test Escape Screening Using Generative Model.

, , and . ITC, page 1-8. IEEE, (2018)

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Michihiro Saito

 

Other publications of authors with the same name

Accurate Failure Rate Prediction Based on Gaussian Process Using WAT Data., , , , and . ITC, page 573-577. IEEE, (2022)Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects., , , , , and . ASP-DAC, page 442-448. ACM, (2023)Intra-Die-Variation-Aware Side Channel Analysis for Hardware Trojan Detection., , , , and . ATS, page 52-57. IEEE Computer Society, (2017)Decimal Multiplication Using Combination of Software and Hardware., , and . APCCAS, page 239-242. IEEE, (2018)Runtime NBTI Mitigation for Processor Lifespan Extension via Selective Node Control., , , , , and . ATS, page 234-239. IEEE Computer Society, (2016)Measurement of BTI-induced Threshold Voltage Shift for Power MOSFETs under Switching Operation., , , and . ATS, page 1-6. IEEE, (2020)An Adaptive Test for Parametric Faults Based on Statistical Timing Information., , , , , , , and . Asian Test Symposium, page 151-156. IEEE Computer Society, (2009)Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation., , , , , and . ACM Great Lakes Symposium on VLSI, page 203-208. ACM, (2016)Variation-Aware Hardware Trojan Detection through Power Side-channel., , , and . ITC, page 1-10. IEEE, (2018)Small Delay Fault Model for Intra-Gate Resistive Open Defects., , , , , , and . VTS, page 27-32. IEEE Computer Society, (2009)