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Text, and . (1988)Digital control of a rotary dryer in the sugar industry.. Autom., 19 (2): 131-148 (1983)Radial Trends in IMF-Sensitive Absorption Features in Two Early-Type Galaxies: Evidence for Abundance-Driven Gradients, , and . (2015)cite arxiv:1506.07880Comment: 16 page body + 7 page appendix + references. Includes 18 figures. Submitted to ApJ.Improving SRAM Vmin and yield by using variation-aware BTI stress., , , , , and . CICC, page 1-4. IEEE, (2010)An Extrinsic Device and Leakage Mechanism in Advanced Bulk FinFET SRAM., , , , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (8): 1819-1827 (2019)Bias-Induced Healing of $V_min$ Failures in Advanced SRAM Arrays., , , , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 25 (2): 660-669 (2017)Nonrandom Device Mismatch Considerations in Nanoscale SRAM., , , and . IEEE Trans. Very Large Scale Integr. Syst., 20 (7): 1211-1220 (2012)The Ring-Loading and Ring-Sizing Problem., and . ICANNGA, page 289-293. Springer, (1997)Bias-Dependent Variation in FinFET SRAM., , , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 28 (5): 1341-1344 (2020)Sub-threshold Circuit Design with Shrinking CMOS Devices., , , and . ISCAS, page 2541-2544. IEEE, (2009)