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IEEE P1687: Toward Standardized Access of Embedded Instrumentation., , , , , , , , and . ITC, page 1-8. IEEE Computer Society, (2006)FALCON: Rapid statistical fault coverage estimation for complex designs., , , , and . ITC, page 1-10. IEEE Computer Society, (2012)Realizing High Test Quality Goals with Smart Test Resource Usage., , , , , , , and . ITC, page 525-533. IEEE Computer Society, (2004)On effective TSV repair for 3D-stacked ICs., , and . DATE, page 793-798. IEEE, (2012)What Do You Mean My Board Test Stinks?. ITC, page 1423. IEEE Computer Society, (2004)Test Economics - What can a Board/System Test Engineer do to Influence Supply Operation Metrics., and . ITC, page 1-9. IEEE Computer Society, (2006)A practical perspective on reducing ASIC NTFs., , , and . ITC, page 7. IEEE Computer Society, (2005)IJTAG (internal JTAG): a step toward a DFT standard., , , , and . ITC, page 8. IEEE Computer Society, (2005)An All Digital Distributed Sensor Network Based Framework for Continuous Noise Monitoring and Timing Failure Analysis in SoCs., , , , , and . ATS, page 269-274. IEEE Computer Society, (2014)No Fault Found: The root cause., , , , , and . VTS, page 1. IEEE Computer Society, (2015)