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A new dynamic test vector compaction for automatic test pattern generation., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 13 (3): 353-358 (1994)FPAD: a fuzzy nonlinear programming approach to analog circuit design., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 14 (7): 785-793 (1995)Worst case tolerance analysis and CLP-based multifrequency test generation for analog circuits., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 18 (3): 332-345 (1999)Design for testability of embedded integrated operational amplifiers., and . IEEE J. Solid State Circuits, 33 (4): 573-581 (1998)Testing Real-Time Properties of Embedded Systems., and . ESA, page 179-185. CSREA Press, (2008)From Global Expression Patterns to Gene Co-regulation in Brain Pathologies., , , and . ERCIM News, 2010 (82): 28-29 (2010)Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop., , and . VLSI Design, (2008)On Reliable Transmission of Data over Simple Wireless Channels., , and . J. Comput. Networks Commun., (2009)Estimation of Simultaneous Switching Power and Ground Noise of Static CMOS Combinational Circuits., , and . EDAC-ETC-EUROASIC, page 658. IEEE Computer Society, (1994)Initiability: A Measure of Sequential Testability., , and . ISCAS, page 1619-1622. IEEE, (1993)