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Другие публикации лиц с тем же именем

Delay Defect Screening using Process Monitor Structures., , , и . VTS, стр. 43-52. IEEE Computer Society, (2004)Packet-Based Input Test Data Compression Techniques., , и . ITC, стр. 154-163. IEEE Computer Society, (2002)Efficient Seed Utilization for Reseeding based Compression., и . VTS, стр. 232-240. IEEE Computer Society, (2003)ELF-Murphy Data on Defects and Test Sets., , , , , , , и . VTS, стр. 16-22. IEEE Computer Society, (2004)ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume., , , , и . ITC, стр. 1069-1078. IEEE Computer Society, (2003)Response compaction with any number of unknowns using a new LFSR architecture., и . DAC, стр. 117-122. ACM, (2005)Test Vector Compression Using EDA-ATE Synergies., , , и . VTS, стр. 97-102. IEEE Computer Society, (2002)Tackling test trade-offs from design, manufacturing to market using economic modeling., , , , и . ITC, стр. 1098-1107. IEEE Computer Society, (2001)Speed Clustering of Integrated Circuits., , , и . ITC, стр. 1128-1137. IEEE Computer Society, (2004)Test Economics for Multi-site Test with Modern Cost Reduction Techniques., , , и . VTS, стр. 411-416. IEEE Computer Society, (2002)