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Disambiguation of "Tehranipoor, Mohammad"

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Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers.

, , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 26 (5): 896-906 (2007)

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Mohammad Mohammad

Mohammad Sadeghi

Metallogenic modeling and mineral potential mapping in the Takab district, NW Iran. Uni Halle-Wittenberg, (2009)

Mohammad Reza Mohammad Khorasani

Mohammad Naghdi

Mohammad Sadeghian

 

Other publications of authors with the same name

Case Study: Efficient SDD test generation for very large integrated circuits., , , , and . VTS, page 78-83. IEEE Computer Society, (2011)Critical Paths Selection and Test Cost Reduction Considering Process Variations., and . Asian Test Symposium, page 259-264. IEEE Computer Society, (2013)Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes., , , , , , , , , and . DDECS, page 376-381. IEEE Computer Society, (2010)Layout-Aware, IR-Drop Tolerant Transition Fault Pattern Generation., , , and . DATE, page 1172-1177. ACM, (2008)Secure Split-Test for preventing IC piracy by untrusted foundry and assembly., , and . DFTS, page 196-203. IEEE Computer Society, (2013)Case study: Detecting hardware Trojans in third-party digital IP cores., and . HOST, page 67-70. IEEE Computer Society, (2011)Defect Tolerance for Molecular Electronics-Based NanoFabrics Using Built-In Self-Test Procedure.. DFT, page 305-313. IEEE Computer Society, (2005)Securing Scan Design Using Lock and Key Technique., , , and . DFT, page 51-62. IEEE Computer Society, (2005)SCT: An Approach For Testing and Configuring Nanoscale Devices., and . VTS, page 370-377. IEEE Computer Society, (2006)Enhanced launch-off-capture transition fault testing., , and . ITC, page 10. IEEE Computer Society, (2005)