( en | de | ru )

 

Disambiguation of "Iwata, Futoshi"

Author of the publication

copydeleteadd this publication to your clipboard
Development of a single cell electroporation method using a scanning ion conductance microscope with a theta type probe pipette.

, , , and . MHS, page 1-5. IEEE, (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Takashi Iwata

Koichiro Iwata

 

Other publications of authors with the same name

Topographical imaging and charge mapping of charged surface using scanning ion conductance microscopy with a theta nanopipette., , , and . MHS, page 1-5. IEEE, (2017)Influence of charged samples on imaging in scanning ion conductance microscopy., , , and . MHS, page 1-4. IEEE, (2013)Development of a single cell electroporation method using a scanning ion conductance microscope with a theta type probe pipette., , , and . MHS, page 1-5. IEEE, (2014)Measurement of shear force and adhesion force of a single adhesion cell using atomic force microscopy with a self-sensitive cantilever., and . MHS, page 1-6. IEEE, (2015)Nanomanipulator based on a high-speed atomic force microscope capable of controlling a cantilever loading force using a magnetic solenoid., , and . MHS, page 1-5. IEEE, (2016)Single cell scraper based on an Atomic Force Microscope., , and . MHS, page 64-69. IEEE, (2012)Micro Fabrication Technique for Three-dimensional Structures based on Localized Electrophoretic Deposition using a Scanning Ion Conductance Microscope., and . MHS, page 1-4. IEEE, (2018)Imaging of an Electret Film Fabricated on a Micro-Machined Energy Harvester by a Kelvin Probe Force Microscope., , , , and . IEEE Trans. Instrum. Meas., (2022)Desktop Teleoperation via the World Wide Web., , and . ICRA, page 660-665. IEEE Computer Society, (1995)Manipulation of one-dimensional nanomaterials using a high-speed atomic force microscope in tapping mode., , and . MHS, page 1-4. IEEE, (2019)