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Disambiguation of "Perniola, Luca"

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Correlated Effects on Forming and Retention of Al Doping in HfO2-Based RRAM.

, , , , , and . IEEE Des. Test, 34 (3): 23-30 (2017)

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Luca Tranchini

Luca Rizzini

Luca Tuninetti

Alfonz Luca

Marcello Lucà

 

Other publications of authors with the same name

Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM., , , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 26 (12): 2599-2607 (2018)Optimal programming with voltage-controlled temperature profile to reduce SET state distribution dispersion in PCM., , , , , and . ICECS, page 482-485. IEEE, (2014)High temperature reliability of μtrench Phase-Change Memory devices., , , , , , , , , and 1 other author(s). Microelectron. Reliab., 52 (9-10): 1928-1931 (2012)Correlated Effects on Forming and Retention of Al Doping in HfO2-Based RRAM., , , , , and . IEEE Des. Test, 34 (3): 23-30 (2017)Optimized temperature profile based pulse generator for innovative Phase Change Memory., , , , and . NEWCAS, page 1-4. IEEE, (2015)Carbon-doped Ge2Sb2Te5 phase-change memory devices featuring reduced RESET current and power consumption., , , , , , , , , and 9 other author(s). ESSDERC, page 286-289. IEEE, (2012)Performance Improvement on HfO2-Based 1T Ferroelectric NVM by Electrical Preconditioning., , , , , , , , and . IRPS, page 1-4. IEEE, (2019)Emerging memory technologies for reconfigurable routing in FPGA architecture., , , , and . ICECS, page 62-65. IEEE, (2010)Identification of the generation/rupture mechanism of filamentary conductive paths in ReRAM devices using oxide failure analysis., , , , and . Microelectron. Reliab., (2017)Phase-change-memory-based storage elements for configurable logic., , , , , , and . FPT, page 17-20. IEEE, (2010)