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Possibilities and limits of axial lifetime control by radiation induced centers in fast recovery diodes., and . Microelectron. J., 35 (3): 259-267 (2004)Investigation of the bipolar degradation of SiC MOSFET body diodes and the influence of current density., , , , , and . IRPS, page 1-6. IEEE, (2021)Surge current capability of IGBTs., , , and . SSD, page 1-6. IEEE, (2012)A simplified algorithm for predicting power cycling lifetime in Direct Drive wind power systems., , , and . SSD, page 1-6. IEEE, (2012)Thermal impedance spectroscopy of power modules., , , , and . Microelectron. Reliab., 51 (9-11): 1679-1683 (2011)Mechanical analysis of press-pack IGBTs., , , , and . Microelectron. Reliab., 52 (9-10): 2397-2402 (2012)Halbleiter-Leistungsbauelemente. Physik, Eigenschaften, Zuverlässigkeit. Springer, Berlin, (2006)Model for Power Cycling lifetime of IGBT Modules – various factors influencing lifetime, , , , and . CIPS 2008, (2008)Power cycling induced failure mechanisms in the viewpoint of rough temperature environment, , , , , and . CIPS 2008, (2008)Topologies for inverter like operation of power cycling tests., , , and . Microelectron. Reliab., (2016)