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A 286 F2/Cell Distributed Bulk-Current Sensor and Secure Flush Code Eraser Against Laser Fault Injection Attack on Cryptographic Processor.

, , , , , , , and . IEEE J. Solid State Circuits, 53 (11): 3174-3182 (2018)

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An On-Chip Multichannel Waveform Monitor for Diagnosis of Systems-on-a-Chip Integration., and . IEEE Trans. Very Large Scale Integr. Syst., 15 (10): 1101-1110 (2007)In-Place Signal and Power Noise Waveform Capturing Within 3-D Chip Stacking., , and . IEEE Des. Test, 32 (6): 87-98 (2015)On-Chip Multi-Channel Monitoring for Analog Circuit Diagnosis in Systems-on-Chip Integration., , and . IEICE Trans. Electron., 90-C (6): 1189-1196 (2007)Co-simulation of On-Chip and On-Board AC Power Noise of CMOS Digital Circuits., , , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 95-A (12): 2284-2291 (2012)Evaluation of SRAM-Core Susceptibility against Power Supply Voltage Variation., , , , , and . IEICE Trans. Electron., 95-C (4): 586-593 (2012)Chip-Level Substrate Coupling Analysis with Reference Structures for Verification., , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 90-A (12): 2651-2660 (2007)Chip-to-Chip Half Duplex Spiking Data Communication over Power Supply Rails., and . IEICE Trans. Electron., 93-C (6): 842-848 (2010)Foreword.. IEICE Trans. Electron., 95-C (6): 977 (2012)An Integrated Timing and Dynamic Supply Noise Verification for Multi-10-Million Gate SoC Designs., , , , , , and . IEICE Trans. Electron., 89-C (11): 1535-1543 (2006)Performance Evaluation of Probing Front-End Circuits for On-Chip Noise Monitoring., , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 96-A (12): 2516-2523 (2013)