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Hotspot-Limited Microprocessors: Direct Temperature and Power Distribution Measurements.

, , , , , , and . IEEE J. Solid State Circuits, 42 (1): 56-65 (2007)

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Thermal-aware task scheduling at the system software level., , , , , and . ISLPED, page 213-218. ACM, (2007)Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling., , , , , , , and . Microelectron. Reliab., 43 (9-11): 1663-1668 (2003)Latchup Analysis Using Emission Microscopy., , , , , , , , , and . Microelectron. Reliab., 43 (9-11): 1603-1608 (2003)Counterfeit IC detection using light emission., , and . ITC, page 1-8. IEEE Computer Society, (2014)Estimating transistor channel temperature using time-resolved and time-integrated NIR emission., , , , , and . IRPS, page 6. IEEE, (2018)Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements., , , , and . IRPS, page 2. IEEE, (2015)Power Distribution Measurements of the Dual Core PowerPCTM 970MP Microprocessor., , , , and . ISSCC, page 2172-2179. IEEE, (2006)Power management of multi-core chips: Challenges and pitfalls., , , , , , , , , and 1 other author(s). DATE, page 977-982. IEEE, (2012)Verification of untrusted chips using trusted layout and emission measurements., , , , , and . HOST, page 19-24. IEEE Computer Society, (2014)Optical and Electrical Testing of Latchup in I/O Interface Circuits., , , , , , , and . ITC, page 236-245. IEEE Computer Society, (2003)