( en | de | ru )

 

Disambiguation of "Jiang, Benben"

Author of the publication

copydeleteadd this publication to your clipboard
Learning heterogeneous reaction kinetics from X-ray videos pixel by pixel.

, , , , , , , , , , and . Nat., 621 (7978): 289-294 (2023)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Ping Jiang

Jiang Yi

Xin Jiang

Kaiyun Jiang

Qiu Jiang

 

Other publications of authors with the same name

Active learning with fairness-aware clustering for fair classification considering multiple sensitive attributes., , and . Inf. Sci., (November 2023)Parallel Bayesian Optimization Using Satisficing Thompson Sampling for Time-Sensitive Black-Box Optimization., and . CoRR, (2023)Latent variable modeling approach for fault detection and identification of process correlations., and . Trans. Inst. Meas. Control, 41 (6): 1740-1749 (2019)Dynamic Minimax Probability Machine-Based Approach for Fault Diagnosis Using Pairwise Discriminate Analysis., , , and . IEEE Trans. Contr. Sys. Techn., 27 (2): 806-813 (2019)Fast Charging of Lithium-Ion Batteries Using Deep Bayesian Optimization with Recurrent Neural Network., , , and . CoRR, (2023)Constrained Bayesian Optimization for Minimum-Time Charging of Lithium-Ion Batteries., and . IEEE Control. Syst. Lett., (2022)Fast Charging of Lithium-ion Batteries by Mathematical Reformulation as Mixed Continuous-Discrete Simulation., , , , and . ACC, page 5265-5270. IEEE, (2022)Learning heterogeneous reaction kinetics from X-ray videos pixel by pixel., , , , , , , , , and 1 other author(s). Nat., 621 (7978): 289-294 (2023)Fault Detection in Industrial Systems Using Maximized Divergence Analysis Approach., and . IEEE Access, (2022)Dynamic Bhattacharyya Bound-Based Approach for Fault Classification in Industrial Processes., and . IEEE Trans. Ind. Informatics, 18 (1): 397-404 (2022)