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Experimental demonstration of stochastic comparators for fine resolution ADC without calibration., , , , и . ICECS, стр. 29-32. IEEE, (2016)Mining sequential patterns including time intervals., , , и . Data Mining and Knowledge Discovery: Theory, Tools, and Technology, том 4057 из SPIE Proceedings, стр. 213-220. SPIE, (2000)High-resolution measurement of magnetic field generated from cryptographic LSIs., , , , , и . SAS, стр. 111-114. IEEE, (2014)A Synthesizable Digital Low-Dropout Regulator Based on Voltage-to-Time Conversion., , , и . VLSI-SoC, стр. 55-58. IEEE, (2018)All-digital PMOS and NMOS process variability monitor utilizing buffer ring with pulse counter., , , , и . ASP-DAC, стр. 79-80. IEEE, (2011)11 Gb/s 140 GHz OOK modulator with 24.6 dB isolation utilising cascaded switch and amplifier-based stages in 65 nm bulk CMOS., , , , и . IET Circuits Devices Syst., 14 (3): 322-326 (2020)Cascaded Time Difference Amplifier with Differential Logic Delay Cell., , , , и . IEICE Trans. Electron., 94-C (4): 654-662 (2011)A Gate Delay Mismatch Tolerant Time-Mode Analog Accumulator Using a Delay Line Ring., , , и . IEICE Trans. Electron., 100-C (9): 736-745 (2017)Exact Minimum-Width Transistor Placement for Dual and Non-dual CMOS Cells., , и . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 88-A (12): 3485-3491 (2005)All-Digital On-Chip Monitor for PMOS and NMOS Process Variability Utilizing Buffer Ring with Pulse Counter., , , , и . IEICE Trans. Electron., 94-C (4): 487-494 (2011)