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Cell-aware analysis for small-delay effects and production test results from different fault models., , , , , , , and . ITC, page 1-8. IEEE Computer Society, (2011)Defect-oriented cell-internal testing., , , , , , , and . ITC, page 285-294. IEEE Computer Society, (2010)Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs., , , , , and . DSD, page 823-829. IEEE Computer Society, (2012)Defect-Oriented Test: Effectiveness in High Volume Manufacturing., , , , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 40 (3): 584-597 (2021)Affordable and Comprehensive Testing of 3-D Stacked Die Devices., , , , , , , , , and 2 other author(s). IEEE Des. Test, 39 (5): 17-25 (2022)Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes., , , , , and . ITC, page 286-292. IEEE, (2023)Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects., , , , and . ITC, page 1-10. IEEE Computer Society, (2007)Cell-aware experiences in a high-quality automotive test suite., , , , , , , , , and 5 other author(s). ETS, page 1-6. IEEE, (2014)DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies., , , , , , , , , and . ITC, page 1-10. IEEE, (2018)Fault collapsing of multi-conditional faults., , and . DDECS, page 42-47. IEEE Computer Society, (2013)