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Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems.

, , , , and . IOLTS, page 135-140. IEEE Computer Society, (2004)

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BTI and leakage aware dynamic voltage scaling for reliable low power cache memories., , , and . IOLTS, page 194-199. IEEE, (2015)Recycled IC detection through aging sensor., , , and . ETS, page 1-2. IEEE, (2018)Diagnosis of power switches with power-distribution-network consideration., , , and . ETS, page 1-6. IEEE, (2015)The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology., , and . Microelectron. Reliab., (2016)Low Cost NBTI Degradation Detection and Masking Approaches., , , and . IEEE Trans. Computers, 62 (3): 496-509 (2013)High-Performance Robust Latches., , and . IEEE Trans. Computers, 59 (11): 1455-1465 (2010)DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 34 (12): 2013-2024 (2015)Visionaria. An Open Design Approach for the Regeneration of Historical Urban Heritage., , and . AHFE (24), volume 975 of Advances in Intelligent Systems and Computing, page 190-201. Springer, (2019)A framework to increase the video-mapping accuracy of an architectural heritage mock-up., , and . VRIC, page 3:1-3:4. ACM, (2014)Novel approach to reduce power droop during scan-based logic BIST., , , , , and . ETS, page 1-6. IEEE Computer Society, (2013)