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Disambiguation of "Hashempour, Hamidreza"

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Analysis and measurement of fault coverage in a combined ATE and BIST environment.

, , and . IEEE Trans. Instrumentation and Measurement, 53 (2): 300-307 (2004)

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Hamidreza Mojallal

Hamidreza Ameli

Hamidreza Atlasbaf

Hamidreza Naeemi

Hamidreza Zarei

 

Other publications of authors with the same name

Defect Oriented Testing for analog/mixed-signal devices., , , , , , and . ITC, page 1-10. IEEE Computer Society, (2011)Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example., , , , , , and . DATE, page 371-376. IEEE, (2011)Error-Resilient Test Data Compression Using Tunstall Codes., , and . DFT, page 316-323. IEEE Computer Society, (2004)A data-set of piercing needle through deformable objects for Deep Learning from Demonstrations., , , and . CoRR, (2020)Analysis and measurement of fault coverage in a combined ATE and BIST environment., , and . IEEE Trans. Instrumentation and Measurement, 53 (2): 300-307 (2004)Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs., , , , , , , and . ITC, page 1-10. IEEE Computer Society, (2009)Evaluation of heuristic techniques for test vector ordering., and . ACM Great Lakes Symposium on VLSI, page 96-99. ACM, (2004)Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs., and . DATE, page 841-846. EDA Consortium, San Jose, CA, USA, (2007)Evaluation of Error-Resilience for Reliable Compression of Test Data., , and . DATE, page 1284-1289. IEEE Computer Society, (2005)Device Model for Ballistic CNFETs Using the First Conducting Band., and . IEEE Des. Test Comput., 25 (2): 178-186 (2008)