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Achieving IDDQ/ISSQ Production Testing with QuiC-Mon.

. IEEE Des. Test Comput., 12 (3): 62-69 (1995)

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Achieving IDDQ/ISSQ Production Testing with QuiC-Mon.. IEEE Des. Test Comput., 12 (3): 62-69 (1995)A General Purpose IDDQ Measurement Circuit., , and . ITC, page 642-651. IEEE Computer Society, (1993)On the Effect of ISSQ Testing in Reducing Early Failure Rate.. ITC, page 910-915. IEEE Computer Society, (1995)