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Characterization of radiation-induced SRAM and logic soft errors from 0.33V to 1.0V in 65nm CMOS.

, , , , , , , , и . CICC, стр. 1-4. IEEE, (2014)

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Yin-Ru Chiang

Chiang Liang

Chiang Mai

Joanna Chiang

Renfu Yin

 

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