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Semiconductor wafer representation for TCAD., , , , , , , , , and 2 other author(s). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 13 (1): 82-95 (1994)Nominality Score Conditioned Time Series Anomaly Detection by Point/Sequential Reconstruction., , , , and . CoRR, (2023)The Effects of Process Variations and BTI in Packaged FinFET Devices., , and . IRPS, page 1-5. IEEE, (2023)A 12b 50MS/s 2.1mW SAR ADC with redundancy and digital background calibration., , and . ESSCIRC, page 109-112. IEEE, (2013)Robust Deep Reinforcement Learning against Adversarial Perturbations on State Observations., , , , , , and . NeurIPS, (2020)NeurOLight: A Physics-Agnostic Neural Operator Enabling Parametric Photonic Device Simulation., , , , , , and . NeurIPS, (2022)Towards Stable and Efficient Training of Verifiably Robust Neural Networks., , , , , , , and . ICLR, OpenReview.net, (2020)Towards Stable and Efficient Training of Verifiably Robust Neural Networks., , , , , and . CoRR, (2019)Design for Manufacturability and Statistical Design - A Constructive Approach., , and . Series on integrated circuits and systems Springer, (2008)Adjusting for Autocorrelated Errors in Neural Networks for Time Series., , and . NeurIPS, page 29806-29819. (2021)