( en | de | ru )

 

Disambiguation of "Han, Zhen"

Author of the publication

copydeleteadd this publication to your clipboard
Learning discriminative features for micro-expression recognition.

, , , and . Multim. Tools Appl., 83 (3): 7761-7783 (January 2024)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Zhen-Han Yao

Zhen Cao

Zhen Li

Zhen Li

Zhen Tian

 

Other publications of authors with the same name

Dynamic Stacked Generalization for Node Classification on Networks., and . CoRR, (2016)A super-resolution method for low-quality face image through RBF-PLS regression and neighbor embedding., , , , and . ICASSP, page 1253-1256. IEEE, (2012)Machine Learning Methods for Industrial Protocol Security Analysis: Issues, Taxonomy, and Directions., , , , , and . IEEE Access, (2020)A portable TPM based on USB key., , and . ACM Conference on Computer and Communications Security, page 750-752. ACM, (2010)Noise Face Image Hallucination via Data-Driven Local Eigentransformation., , , , , and . PCM, volume 8879 of Lecture Notes in Computer Science, page 183-192. Springer, (2014)Develop Secure Database System with Security Extended ER Model., , , and . KES (3), volume 3683 of Lecture Notes in Computer Science, page 1005-1010. Springer, (2005)Global Face Super Resolution and Contour Region Constraints., , , , and . ISNN (2), volume 6064 of Lecture Notes in Computer Science, page 120-127. Springer, (2010)Dynamic Privacy Leakage Analysis of Android Third-Party Libraries., , and . ICDIS, page 275-280. IEEE, (2018)A Joint Denoising Learning Model for Weight Update Space-Time Diversity Method., , , and . Remote. Sens., 14 (10): 2430 (2022)Distributed Adaptive Formation Tracking Control of Mobile Robots With Event-Triggered Communication and Denial-of-Service Attacks., , , and . IEEE Trans. Ind. Electron., 70 (4): 4077-4087 (2023)