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A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic., , , , and . J. Electron. Test., 29 (3): 331-340 (2013)Nonlinear Codes for Control Flow Checking., and . ETS, page 1-6. IEEE, (2020)PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community., , , , , , , and . ETS, page 1-10. IEEE, (2020)Secure PUF-based Authentication and Key Exchange Protocol using Machine Learning., , , , and . ISVLSI, page 386-389. IEEE, (2022)Elaborating on Sub-Space Modeling as an Enrollment Solution for Strong PUF., , , and . DCOSS, page 394-399. IEEE, (2022)STT-MRAM-Based Strong PUF Architecture., , , and . ISVLSI, page 467-472. IEEE Computer Society, (2015)New security threats against chips containing scan chain structures., , , and . HOST, page 110. IEEE Computer Society, (2011)Laser-Induced Fault Simulation., , , and . DSD, page 609-614. IEEE Computer Society, (2013)Faster-than-at-speed execution of functional programs: An experimental analysis., , , , and . VLSI-SoC, page 1-6. IEEE, (2016)Challenges in designing trustworthy cryptographic co-processors., , , , , , , , , and 2 other author(s). ISCAS, page 2009-2012. IEEE, (2015)