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Scanning spreading resistance microscopy for failure analysis of nLDMOS devices with decreased breakdown voltage., , , , , , , , and . Microelectron. Reliab., 54 (9-10): 2128-2132 (2014)2021 Roadmap on Neuromorphic Computing and Engineering., , , , , , , , , and 46 other author(s). CoRR, (2021)Extraction of the active acceptor concentration in (pseudo-) vertical GaN MOSFETs using the body-bias effect., , , , , , , , , and . Microelectron. J., (2019)Design Enablement Flow for Circuits with Inherent Obfuscation based on Reconfigurable Transistors., , , , , , , , , and 6 other author(s). DATE, page 1-6. IEEE, (2023)END-TRUE: Emerging Nanotechnology-Based Double-Throughput True Random Number Generator., , , , , , , and . VLSI-SoC (Selected Papers), volume 661 of IFIP Advances in Information and Communication Technology, page 175-203. Springer, (2021)Reconfigurable nanowire transistors with multiple independent gates for efficient and programmable combinational circuits., , , , , , and . DATE, page 169-174. IEEE, (2016)A pseudo-memcapacitive neurotransistor for spiking neural networks., , , , , , and . MOCAST, page 1-5. IEEE, (2023)Ultra-dense co-integration of FeFETs and CMOS logic enabling very-fine grained Logic-in-Memory., , , , , , , , and . ESSDERC, page 118-121. IEEE, (2019)In-depth electrical characterization of carrier transport in ambipolar Si-NW Schottky-barrier FETs., , , , , , , and . ESSDERC, page 304-307. IEEE, (2017)Localization of temperature sensitive areas on analog circuits., , and . Microelectron. J., 45 (6): 734-739 (2014)