( en | de | ru )

 

Disambiguation of "DeVries, Byron"

Author of the publication

copydeleteadd this publication to your clipboard
An Algorithm to solve a Facility Location Problem using a Discrete Approximation to the Voronoi Diagram.

, , and . EIT, page 86-90. IEEE, (2021)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Uta Devries

Byron Cosmidis

Byron Chalidis

Byron Katsaros

Byron Protopsaltis

 

Other publications of authors with the same name

A Divide-and-Conquer Algorithm for Computing Voronoi Diagrams., , and . EIT, page 495-499. IEEE, (2020)Automatic Detection of Incomplete Requirements Using Symbolic Analysis and Evolutionary Computation., and . SSBSE, volume 10452 of Lecture Notes in Computer Science, page 49-64. Springer, (2017)A Novelty Search and Metamorphic Testing Approach to Automatic Test Generation., and . SBST@ICSE, page 8-11. IEEE, (2021)Parallel Implementations of FGMRES for Solving Large, Sparse Non-Symmetric Linear Systems., , , , and . ICCS, volume 18 of Procedia Computer Science, page 491-500. Elsevier, (2013)Using Metamorphic Relationships and Genetic Algorithms to Test Open-Source Software., and . EIT, page 342-345. IEEE, (2022)Data Allocation and Replication in Data Center: Tradeoff and Solutions., , , and . EIT, page 239-244. IEEE, (2020)Calculating an Approximate Voronoi Diagram using QuadTrees and Triangles., , and . eIT, page 133-136. IEEE, (2023)Run-time monitoring of self-adaptive systems to detect N-way feature interactions and their causes., and . SEAMS@ICSE, page 94-100. ACM, (2018)Towards run-time adaptation of test cases for self-adaptive systems in the face of uncertainty., , and . SEAMS, page 17-26. ACM, (2014)Automatic Detection of Feature Interactions Using Symbolic Analysis and Evolutionary Computation., and . QRS, page 257-268. IEEE, (2018)