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Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM., , , , , и . DATE, стр. 1717-1722. IEEE, (2021)Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis., , , , , , , , и . VTS, стр. 1-10. IEEE, (2020)A novel mathematical model for predicting landslide displacement., , и . Soft Comput., 25 (3): 2453-2466 (2021)A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs., , , , , , и . DATE, стр. 792-797. IEEE, (2020)Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions., , , , , и . ITC, стр. 143-152. IEEE, (2021)Special Session: STT-MRAMs: Technology, Design and Test., , , , , и . VTS, стр. 1-10. IEEE, (2022)A Hybrid Kernel Pruning Approach for Efficient and Accurate CNNs., , , , , , , и . ICA3PP (7), том 14493 из Lecture Notes in Computer Science, стр. 34-46. Springer, (2023)Device-Aware Test: A New Test Approach Towards DPPB Level., , , , , , , и . ITC, стр. 1-10. IEEE, (2019)Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing., , , , , , , , и . ETS, стр. 1-6. IEEE, (2019)A new grey prediction model and its application to predicting landslide displacement., , , и . Appl. Soft Comput., (2020)