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Disambiguation of "Holst, Stefan"

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Targeted Partial-Shift For Mitigating Shift Switching Activity Hot-Spots During Scan Test.

, , and . PRDC, page 124-129. IEEE, (2019)

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Stefan Holst

Stefan Holst

Stefan Holst

Stefan Holst

Joachim Holst

 

Other publications of authors with the same name

Targeted Partial-Shift For Mitigating Shift Switching Activity Hot-Spots During Scan Test., , and . PRDC, page 124-129. IEEE, (2019)Evaluation and Test of Production Defects in Hardened Latches., , , , and . IEICE Trans. Inf. Syst., 105-D (5): 996-1009 (2022)Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling., , and . MCSoC, page 501-507. IEEE, (2023)BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell., , , , and . ETS, page 1-6. IEEE, (2023)Logic Fault Diagnosis of Hidden Delay Defects., , , , , , and . ITC, page 1-10. IEEE, (2020)A Fault-Tolerant MPSoC For CubeSats., , , , , , , , , and . DFT, page 1-6. IEEE, (2019)STAHL: A Novel Scan-Test-Aware Hardened Latch Design., , , , and . ETS, page 1-6. IEEE, (2019)On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption., , , , , and . IEICE Trans. Inf. Syst., 104-D (6): 816-827 (2021)Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses., , , , and . ITC, page 1-10. IEEE, (2019)On the Impact of Hardware Timing Errors on Stochastic Computing based Neural Networks., , and . ETS, page 1-6. IEEE, (2022)