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Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction., , , , , , , and . IRPS, page 1-6. IEEE, (2021)Do ICT Competence in and ICT Service Use Affect Life Satisfaction? Focusing on Mobile ICT Services., , , , and . HCI (48), volume 1654 of Communications in Computer and Information Science, page 156-163. Springer, (2022)Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology., , , , , , , , , and 3 other author(s). IRPS, page 1-5. IEEE, (2020)Localized Layout Effect Related Reliability Approach in 8nm FinFETs Technology: From Transistor to Circuit., , , , , and . IRPS, page 1-5. IEEE, (2019)A systematic study of gate dielectric TDDB in FinFET technology., , , , , , , , and . IRPS, page 4. IEEE, (2018)Investigation of BTI characteristics and its behavior on 10 nm SRAM with high-k/metal gate FinFET technology having multi-VT gate stack., , , , , , and . Microelectron. Reliab., (2018)ICT-based person-centered community care platform (IPC3P) to enhance shared decision-making for integrated health and social care services., , , , , , , , , and 2 other author(s). Int. J. Medical Informatics, (2021)Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk., , , , , , , , and . IRPS, page 1-4. IEEE, (2023)