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7-nm FinFET CMOS Design Enabled by Stress Engineering Using Si, Ge, and Sn, , , , and . Electron Devices, IEEE Transactions on, 61 (5): 1222-1230 (May 2014)An analytical compact model for estimation of stress in multiple Through-Silicon Via configurations., , , , , , , , , and . DATE, page 505-506. IEEE, (2011)Analysis of microbump induced stress effects in 3D stacked IC technologies., , , , , , , , , and 9 other author(s). 3DIC, page 1-5. IEEE, (2011)Through silicon via to FinFET noise coupling in 3-D integrated circuits., , , , , , , , , and 3 other author(s). ICICDT, page 1-4. IEEE, (2015)A Modification of the Fast Inverse Square Root Algorithm., , and . Comput., 7 (3): 41 (2019)Efficient Floating-Point Division for Digital Signal Processing Application Tips & Tricks., and . IEEE Signal Process. Mag., 36 (1): 159-163 (2019)Simple Multiple Precision Algorithms for Exponential Functions Tips & Tricks., , , and . IEEE Signal Process. Mag., 39 (4): 130-137 (2022)Improving the Accuracy of the Fast Inverse Square Root by Modifying Newton-Raphson Corrections., , and . Entropy, 23 (1): 86 (2021)Fast exact digital differential analyzer for circle generation., , and . Appl. Math. Comput., (2015)Instantaneous Interference Evaluation Model for Smart Antennas in 5G Ultra-Dense Networks., , , and . NEW2AN/ruSMART, volume 13158 of Lecture Notes in Computer Science, page 365-376. Springer, (2021)