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Application-Independent Testing of 3-D Field Programmable Gate Array Interconnect Faults.

, , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (2): 207-219 (2014)

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BIST-based diagnosis scheme for field programmable gate array interconnect delay faults., , , and . IET Comput. Digit. Tech., 1 (6): 716-723 (2007)Application-Independent Testing of 3-D Field Programmable Gate Array Interconnect Faults., , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (2): 207-219 (2014)Double-Sided 2.5D Graphics., , , , , and . IEEE Trans. Vis. Comput. Graph., 19 (2): 225-235 (2013)A BIST Scheme for FPGA Interconnect Delay Faults., , , , and . VTS, page 201-206. IEEE Computer Society, (2005)An Application-Independent Delay Testing Methodology for Island-Style FPGA., , , and . DFT, page 478-486. IEEE Computer Society, (2004)