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Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers., , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (10): 3426-3435 (октября 2023)High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis., , , , , и . ETS, стр. 1-4. IEEE, (2023)Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs., , , , , , , и . ITC, стр. 1-10. IEEE, (2020)Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing., , , , , и . VTS, стр. 1-6. IEEE, (2020)Extended Realities for Sensorially Diverse Children., , , , , , , , , и 2 other автор(ы). IEEE Computer Graphics and Applications, 44 (4): 26-39 (июля 2024)Recent Trends and Perspectives on Defect-Oriented Testing., , , , , , , , , и 11 other автор(ы). IOLTS, стр. 1-10. IEEE, (2022)Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs., , , , , , и . ITC, стр. 1-4. IEEE, (2019)Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing., , , , , и . ETS, стр. 1-6. IEEE, (2020)Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics., , , , , , , и . ETS, стр. 1-6. IEEE, (2020)0.3 V supply, 17 ppm/°C 3-transistor picowatt voltage reference., , , и . LASCAS, стр. 263-266. IEEE, (2016)