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Maximum sequence test pattern generators with irreducible characteristic polynomials., , and . Microprocess. Microsystems, 30 (2): 117-123 (2006)Deterministic Built-in TPG with Segmented FSMs., , and . IOLTS, page 261-266. IEEE Computer Society, (2008)DV-TSE: Difference Vector Based Test Set Embedding., , , and . VLSI-SOC, page 343-. Technische Universität Darmstadt, Insitute of Microelectronic Systems, (2003)A similarity transform for linear finite state machines.. Discret. Appl. Math., 154 (11): 1570-1577 (2006)Transistor-Level Synthesis for Low-Power Applications., and . ISQED, page 607-612. IEEE Computer Society, (2007)Using a WLFSR to Embed Test Pattern Pairs in Minimum Time., and . IOLTW, page 75-79. IEEE Computer Society, (2001)Built-In TPG with Designed Phaseshifts.. VTS, page 365-370. IEEE Computer Society, (2003)AUCTSP: an improved biomarker gene pair class predictor., , and . BMC Bioinform., 19 (1): 244:1-244:13 (2018)MOTO-X: A Multiple-Output Transistor-Level Synthesis CAD Tool.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 35 (1): 114-127 (2016)Methods for on-chip embedding of path delay test vectors., and . ISCAS, page 84-87. IEEE, (2000)