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A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection., , and . ICECS 2022, page 1-2. IEEE, (2022)A Machine Learning Approach Towards SKILL Code Autocompletion., , and . CoRR, (2023)SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering., , , , and . CoRR, (2023)SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection., , , , , and . CoRR, (2023)YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach., , , , , , and . CoRR, (2023)A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation., , , and . CoRR, (2023)Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review., , , , , and . CoRR, (2023)Code Generation Using Machine Learning: A Systematic Review., , , , and . IEEE Access, (2022)Optimizing YOLOv7 for Semiconductor Defect Detection., , , and . CoRR, (2023)Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization., , , and . CoRR, (2023)