Author of the publication

Multilevel Ionizing-Induced Transient Fault Simulator.

, , , and . Inf. Secur. J. A Glob. Perspect., 22 (5-6): 251-264 (2013)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

SECCS: SECure Context Saving for IoT Devices., , , , , and . CoRR, (2019)On-chip test comparison for protecting confidential data in secure ICs., , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)Experimentations on scan chain encryption with PRESENT., , , and . IVSW, page 45-50. IEEE, (2017)Laser-Induced Fault Effects in Security-Dedicated Circuits., , , , , , , , , and 5 other author(s). VLSI-SoC (Selected Papers), volume 464 of IFIP Advances in Information and Communication Technology, page 220-240. Springer, (2014)Reliability of computing systems: From flip flops to variables., , , , and . IOLTS, page 196-198. IEEE, (2017)Frontside Versus Backside Laser Injection: A Comparative Study., , , , and . JETC, 13 (1): 6:1-6:15 (2016)Computing reliability: On the differences between software testing and software fault injection techniques., , , , , and . Microprocess. Microsystems, (2017)Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview., , , , , , , , , and 1 other author(s). Microprocess. Microsystems, 39 (8): 1204-1214 (2015)Holding Conferences Online due to COVID-19: The DATE Experience., and . IEEE Des. Test, 37 (3): 116-118 (2020)Nonlinear Codes for Control Flow Checking., and . ETS, page 1-6. IEEE, (2020)