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System to Optimize Test Quality and Efficiency for Memories and LSI.

, , , , and . ITC, page 31-37. IEEE Computer Society, (1981)

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Selecting Computer Systems: Evolving Ideas and Techniques (panel abstract)., , , , and . Int. CMG Conference, page 45. Computer Measurement Group, (1979)System to Optimize Test Quality and Efficiency for Memories and LSI., , , , and . ITC, page 31-37. IEEE Computer Society, (1981)Evolution of ADP Procurement.. Int. CMG Conference, page 41-44. Computer Measurement Group, (1979)