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Low power digital design in FPGAs (poster abstract): a study of pipeline architectures implemented in a FPGA using a low supply voltage to reduce power consumption.

A. García, J. Danger, and W. Burleson. FPGA, page 220. ACM, (2000)

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Jean-Luc Wolfender

Jean-Luc Rebière

Jean-Luc Boevé

Jean-Luc Régnier

Jean-Luc Wagner

Other publications of authors with the same name

Water- PUF: An Insider Threat Resistant PUF Enrollment Protocol Based on Machine Learning Watermarking.S. Khalfaoui, J. Leneutre, A. Villard, I. Gazeau, J. Ma, J. Danger, and P. Urien. NCA, page 1-10. IEEE, (2021)On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability.M. Anik, M. Ebrahimabadi, H. Pirsiavash, J. Danger, S. Guilley, and N. Karimi. ICCD, page 506-509. IEEE, (2020)Special Session: Security Verification & Testing for SR-Latch TRNGs.J. Bahrami, M. Ebrahimabadi, J. Danger, S. Guilley, and N. Karimi. VTS, page 1-10. IEEE, (2023)Detecting Laser Fault Injection Attacks via Time-to-Digital Converter Sensors.M. Ebrahimabadi, S. Mehjabin, R. Viera, S. Guilley, J. Danger, J. Dutertre, and N. Karimi. HOST, page 97-100. IEEE, (2022)On the Effect of Aging on Digital Sensors.M. Anik, S. Guilley, J. Danger, and N. Karimi. VLSID, page 189-194. IEEE, (2020)Evaluation of delay PUFs on CMOS 65 nm technology: ASIC vs FPGA.Z. Cherif, J. Danger, F. Lozach, Y. Mathieu, and L. Bossuet. HASP@ISCA, page 4. ACM, (2013)System-Level Methods to Prevent Reverse-Engineering, Cloning, and Trojan Insertion.S. Guilley, J. Danger, R. Nguyen, and P. Nguyen. ICISTM, volume 285 of Communications in Computer and Information Science, page 433-438. Springer, (2012)Fault Analysis Attack on an FPGA AES Implementation.F. Khelil, M. Hamdi, S. Guilley, J. Danger, and N. Selmane. NTMS, page 1-5. IEEE, (2008)On the entropy of Physically Unclonable Functions.O. Rioul, P. Solé, S. Guilley, and J. Danger. ISIT, page 2928-2932. IEEE, (2016)PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community.A. Alipour, V. Beroulle, B. Cambou, J. Danger, G. Natale, D. Hély, S. Guilley, and N. Karimi. ETS, page 1-10. IEEE, (2020)

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Disambiguation of "Danger, Jean-Luc"