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Reversible dielectric breakdown in ultrathin Hf based high-k stacks under current-limited stresses.

, , , , and . Microelectron. Reliab., 49 (9-11): 1024-1028 (2009)

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A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level., , , , , , , and . Integr., (2020)On the Impact of the Biasing History on the Characterization of Random Telegraph Noise., , , , , , and . IEEE Trans. Instrum. Meas., (2022)Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits., , , , , , , and . IEEE Trans. Instrum. Meas., 69 (3): 853-864 (2020)Reversible dielectric breakdown in ultrathin Hf based high-k stacks under current-limited stresses., , , , and . Microelectron. Reliab., 49 (9-11): 1024-1028 (2009)A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation., , , , , , and . SMACD, page 1-4. IEEE, (2022)CASE: A reliability simulation tool for analog ICs., , , , , , , and . SMACD, page 1-4. IEEE, (2017)Experimental Characterization of Time-Dependent Variability in Ring Oscillators., , , , , , and . SMACD, page 229-232. IEEE, (2019)Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator., , , , , , , , , and . DATE, page 78-83. IEEE, (2019)A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices., , , , , , , , and . IRPS, page 1-5. IEEE, (2019)Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs., , , , , , and . Microelectron. Reliab., 52 (9-10): 1924-1927 (2012)