From post

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation., , , , и . Microelectron. Reliab., (2017)L-Verse: Bidirectional Generation Between Image and Text., , , , , , , , и . CVPR, стр. 16505-16515. IEEE, (2022)CEDe: A collection of expert-curated datasets with atom-level entity annotations for Optical Chemical Structure Recognition., , , , , , , , , и 1 other автор(ы). NeurIPS, (2022)SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET., , , , , и . IRPS, стр. 1-6. IEEE, (2019)Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit., , , , , , , и . IRPS, стр. 1. IEEE, (2018)Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices., , , , , , и . IRPS, стр. 4. IEEE, (2015)New smith predictor control using disturbance observer for steam superheater and steam pressure of the boiler., , , и . ICARCV, стр. 979-981. IEEE, (2008)Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams., , , , , , , и . IRPS, стр. 3. IEEE, (2015)Soft Error Issues with Scaling Technologies., , , , , и . Asian Test Symposium, стр. 68. IEEE Computer Society, (2012)FadeNet: Deep Learning-Based mm-Wave Large-Scale Channel Fading Prediction and its Applications., , , , , , , , и . IEEE Access, (2021)